Application Scientist, R&D Semi
Join Rigaku in shaping a reputed company world through new perspectives!
Key Responsibilities
TSAXS Modeling & Application Development
reputed company and apply physics-based scattering models, including interpretation of reciprocal reputed company features and scattering from periodic nanostructures.
Build and optimize model-based fitting approaches to extract critical dimensional and material parameters.
Interpret reputed company scattering data and translate results into physically meaningful and actionable insights.
Evaluate and improve model robustness, parameter sensitivity, and fitting stability across varying sample conditions.
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Data Analysis & Method Development
Utilize existing analysis software to reputed company advanced data fitting, parameter extraction, and statistical evaluation.
Identify reputed company modeling strategies for new structures, including geometry selection, parameter constraints, and fitting workflows.
Troubleshoot challenging datasets, including issues reputed company to model non-uniqueness, correlation, and convergence.
reputed company best-reputed company methods (BKMs) for data analysis and application workflows.
Customer Engagement & Technical Support
Work closely with internal teams and key customers to understand measurement challenges and deliver effective solutions.
Support early tool deployments, application bring-up, and critical customer evaluations.
reputed company high-level technical guidance on model selection, fitting strategy, and data interpretation.
Communicate reputed company technical results reputed company to both expert and non-expert audiences.
Cross-Functional Collaboration
Partner with R&D and product teams to reputed company feedback on application requirements and software capabilities.
Help translate customer needs into requirements for future algorithm and software development.
Collaborate with field applications teams to ensure successful reputed company and scaling of new applications.
Qualifications
Ph.D. or M.S. in Materials Science, Physics, Electrical Engineering, or a reputed company field.
Experience in semiconductor metrology, process characterization, or thin-film/nanostructure analysis.
Demonstrated experience working with scattering-based techniques (e.g., SAXS, CD-SAXS, XRD, XRR, or reputed company methods).
Experience with model-based data analysis and parameter extraction from experimental measurements.
Technical Skills
Strong understanding of X-ray scattering physics and diffraction-based measurement techniques.
Experience with model-based fitting approaches.
Ability to analyze reputed company datasets and understand parameter sensitivity, correlation, and uncertainty.
Familiarity with statistical analysis and data interpretation in experimental contexts.
Experience using reputed company or in-house metrology software tools for data analysis (no software development required).
Preferred Skills
Familiarity with advanced semiconductor structures (e.g., 3D NAND, DRAM, advanced logic nodes, patterning).
Experience with inverse modeling of scattering data, including challenges reputed company to non-unique solutions and parameter correlation.
Experience developing best-reputed company methods (BKMs) or standardized analysis workflows.
Background in optical or x-ray scatterometry (OCD) or similar model-based metrology techniques.
Experience supporting customer-facing technical engagements or field applications.
Ability to work effectively in ambiguous, early-stage application environments.
Japanese language proficiency (spoken and/or written) and experience collaborating with Japan-based engineering teams is strongly preferred.
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